Application Development: Associated Content

iVSL App

Based on our close working relationship with leading manufacturers in the metrology industry, SURVICE Metrology is in a unique position to help influence, integrate, and customize metrology technology and software tools to best fit our customers’ needs.  We are adept at developing, customizing, and integrating software tools with emerging technology and methods to support our innovative metrology efforts.

  • Enhanced CLR
  • HawkEye
  • I-Cars
  • VSL - High speed computing and visualization
  • Holos
  • Structure from Motion

Learn More

Event Date: 
Monday, July 23, 2018 to Friday, July 27, 2018
Grand Sierra Resort, Reno, Nevada
Automatic Stitching of Hand-Held LIDAR Scans using Photogrammetry and Structure-from-Motion
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